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Location:
Eurofins MASER
Auke Vleerstraat 26
7521 PG Enschede
The Netherlands
Day 1 Program
Session 1: Large-Volume EFA to PFA
"Lock-in Thermography, A Non-destructive Failure Isolation Method for Automotive Electronics"
"Large-Volume Analysis for Packaged and Power Electronics with Plasma-FIB"
Invited Speaker Topic: Large-volume analysis
Demo: Thermo Scientific Helios 5 Hydra DualBeam PFIB
Session 2: Circuit Edit
"FIB Circuit Edit Enables Reliable and Efficient Device Debug, Repair, and Prototyping"
Invited Speaker Topic: Circuit Edit
Demo: Thermo Scientific Centrios Circuit Edit System
Eurofins MASER Facility Tour
Dinner
Day 2 Program
Session 3: User Group Meeting
Featured use-case presentations and round-table discussion
Session 4: Sample Preparation and Analysis
"TEM Sample Preparation, Satisfying the Growing Industry Need for High-Quality Samples"
"Delivering Fast, Repeatable Data for Fundamental Device Characterization with (S)TEM analysis"
Invited Speaker Topic: TEM sample preparation
Demo: Thermo Scientific Helios 5 UX DualBeam and Thermo Scientific Talos F200 (S)TEM
Lunch
University of Twente Facility Tour (optional)
Invited speaker list for these topics:
Coen Hieltjes, Eurofins MASER
Jeffrey Gutierrez, IMEC
Piet de Pauw, IMEC
Leon van Nimwegen, NXP Semiconductors
Martina Tsvetanova, University of Twente
Melissa Goodwin, University of Twente
Antoine Reverdy, Sector Technologies
David Donnet, Thermo Fisher Scientific
Dominique Delille, Thermo Fisher Scientific
Jack Yan, Thermo Fisher Scientific
Hotel recommendations:
Attendees are responsible for their own hotel and transportation to and from the event.