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Center for electron microscopy in Eindhoven, The Netherlands
Investing in new instrumentation or capital equipment is never easy, and you always want to make sure you’re getting the perfect solution that matches your current needs and future expectations. While documentation, such as whitepapers or datasheets, can give you insight into the capability of our instruments, dedicated software, and professional services, it’s unlikely to perfectly align with your unique challenges, samples, and use cases. That’s why we believe that the best way for you to gauge if a solution is right for you is by experiencing it.
Our NanoPort Facility, located in Eindhoven, the Netherlands, is an Electron Microscopy (EM) Center Of Excellence where you can develop and advance your skills with trusted solutions and support, both from our in-house experts as well as from your peers. The NanoPort Facility offers dedicated workflow support through demonstrations, sample work, workshops, and training for researchers and engineers in the life sciences, materials science, and semiconductor fields.
Eindhoven NanoPort Facility
Achtseweg Noord 5
5651 GG Eindhoven, The Netherlands
Phone: +31 40 23 56000
Eindhoven electron microscopy center of excellence
Electron microscopy techniques
The Eindhoven NanoPort Facility has over 30 professionals with many years of hands-on experience at customer sites and most of them hold a PhD or MSc in their area of expertise.
We invite you to bring your own sample to the Eindhoven NanoPort Facility to personally experience the difference our instrumentation, software, and knowledge can make for your challenging analysis and characterization needs.
See the Thermo Fisher Scientific difference – the expertise and analytical techniques available at the Eindhoven NanoPort Facility include:
For materials science
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- DualBeam microscopy (combined focused ion beam and SEM (FIB-SEM) tools)
For semiconductors
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- DualBeam microscopy (combined focused ion beam and SEM (FIB-SEM) tools)
Events at the Eindoven NanoPort electron microscopy facility in Eindhoven, The Netherlands
Ask The Expert Series: Forums that invite well-known experts in their respective industries to share their thoughts and insights on the current and future state of the technology.
Community Outreach Events: Active participation in the Dutch Technology Week and the National Girls Day to showcase innovation in the high-tech sector and promote STEM education among young girls.
In-house Demonstrations: First-hand demonstration of our EM capabilities.
In-house Training: Hands-on, in-person training that helps you build your EM application skills.
Remote Demonstrations: Online, real-time demonstrations of EM applications and features.
Remote Roadshows: A combination of online, real-time demonstrations and technical presentations, focusing on a specific subject or industry.
On-site Training: Hands-on, in-person training at your EM facility to help build your application skills.
Thought-leader Presentations: Invited customers present and share their knowledge in industry specific sessions.
Workshops: A combination of discussions, presentations, and practical work focusing on a specific subject or industry, where attendees are encouraged to share their knowledge and experience.
Please contact us to learn more about the cost of these events and how to schedule them.
Electron Microscope Training
The training needs of each facility can vary greatly. To address these challenges, we have developed flexible training options to bring our best application scientists and training material to you, no matter where you are in the world. Onsite training, remote training, and eLearning options each have advantages while serving different needs, so the best approach is often a blend of all three learning experiences.
Electron microscopes and analytical instruments available at the Eindhoven electron microscopy facility
DualBeam instruments
Thermo Scientific Arctis Cryo-Plasma-FIB Tool specifically designed for automated, high-throughput production of cryo-lamellae from vitrified cells with and Autoloader system that provides a unique, direct connection between cryo-FIB-SEM sample preparation and cryo-TEM within the tomography workflow. For Life Sciences
Thermo Scientific Helios Hydra UX DualBeam (Plasma FIB) Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation. For Materials Science, Semiconductors
Thermo Scientific Helios 5 PFIB Laser DualBeam Combined plasma focused ion beam milling with femtosecond laser ablation and SEM (scanning electron microscopy) imaging. For Materials Science, Semiconductors
Thermo Scientific Helios 5 UX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductors, Life Sciences
Thermo Scientific Helios 5 UC DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductors, Life Sciences
Thermo Scientific Scios 2 DualBeam Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization. For Materials Science, Semiconductors, Life Sciences
Thermo Scientific Aquilos 2 DualBeam Cryo-EM sample preparation tool with extended run time and enhanced automation. For Life Sciences
Transmission Electron Microscopes
Thermo Scientific Tundra Cryo-TEM A dedicated structural analysis solution designed to bring cryo-electron microscopy (cryo-EM) to your laboratory at an affordable price point. For Life Sciences
Thermo Scientific Krios G4 Cryo-TEM Atomic resolution cryo-EM instrument with enhanced productivity and compact design. For Life Sciences
Thermo Scientific Spectra Ultra S/TEM High resolution TEM and STEM microscope for all materials science and semiconductor applications. For Materials Science, Semiconductors
Thermo Scientific Spectra 300 TEM High resolution TEM and STEM microscope for all materials science and semiconductor applications. For Materials Science, Semiconductors
Thermo Scientific Talos F200X TEM TEM microscope for high resolution TEM and STEM with accurate chemical quantification. For Materials Science, Semiconductors
Thermo Scientific Talos L120C TEM TEM microscope for sample screening and high contrast TEM and STEM imaging of beam sensitive materials. For Materials Science, Semiconductors, Life Sciences
Thermo Scientific Glacios 2 Cryo-TEM Sample optimization and high resolution data acquisition made easy. For Life Sciences
Scanning Electron Microscopes
Thermo Scientific Axia ChemiSEM SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. For Materials Science
Thermo Scientific Apreo 2 SEM Scanning electron microscope for versatile, high performance materials imaging and analysis. For Semiconductors, Materials Science, Life Sciences
Thermo Scientific Quattro ESEM Environmental scanning electron microscope (ESEM) for the study of materials in their natural state. For Semiconductors, Materials Science, Life Sciences
Broad Ion Beam Polisher
Thermo Scientific CleanMill Broad Ion Beam System A complete ion beam polishing solution for SEM applications in materials science, enabling optimal imaging and analysis of materials where a pristine surface is required, including beam- and air-sensitive materials. For Materials Science, Semiconductor
Sample Vitrification System
Thermo Scientific Vitrobot MK IV System Reproducible vitrification of biological samples. For Life Sciences
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