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K-Alpha XPS System for materials surface analysis
The Thermo Scientific K-Alpha X-Ray Photoelectron Spectrometer (XPS) System brings a new approach to surface analysis. Focused on delivering high-quality results using a streamlined workflow, the K-Alpha XPS System makes XPS operation simple and intuitive, with no sacrifice in performance or capabilities.
Advanced performance, reduced cost of ownership, increased ease of use, and high sample throughput make the K-Alpha XPS System ideal for a multi-user environment. The K-Alpha XPS System gives more researchers around the world access to surface analysis.
Designed for productivity, from research to routine
The K-Alpha XPS System delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the ability to acquire data at higher resolution yielding better chemical state identification.
Analytical options include a vacuum transfer module for moving air-sensitive samples from a glove box to the system and the tilt module for ARXPS data collection. Equipped with Thermo Scientific Avantage Software, a complete surface analysis software system, the K-Alpha XPS System has a range of software features designed to optimize data interpretation, data reporting, and usability. The K-Alpha XPS System meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS, sputter depth profiling, intelligent automation, and intuitive control.
Powerful performance
The K-Alpha XPS System offers powerful performance and unparalleled ease of use designed to meet the highest standards in the industry. Experience advanced capabilities such as selectable area spectroscopy, sputter depth profiling, a micro-focused monochromator, and snapshot acquisition. Benefit from high-resolution chemical state spectroscopy, insulator analysis, and quantitative chemical imaging for precise and reliable results.
Unparalleled ease of use
Our platform simplifies acquisition of spectra, images, profiles, and line scans while facilitating interpretation by identifying elemental and chemical state. Streamline your processing tasks with features like quantification, peak fitting, real-time profile display, spectrum-image manipulation, PCA, phase analysis, TFA, NLLSF, PSF removal, and optical and XPS image overlays. Reporting is made effortless with automatic report generation and easy export to other software packages. Control all hardware seamlessly through the Avantage Software interface, which also includes the Avantage Indexer for efficient data archive management. Ensure accuracy and compliance with audit trail logging, system performance logging, and calibration on demand. Enjoy the flexibility of full remote operation, making our solution the ultimate choice for your analytical needs.
Key system features
The K-Alpha XPS System offers powerful performance and unparalleled ease of use designed to meet the highest standards in the industry. Experience advanced capabilities such as selectable area spectroscopy, sputter depth profiling, a micro-focused monochromator, and snapshot acquisition. Benefit from high-resolution chemical state spectroscopy, insulator analysis, and quantitative chemical imaging for precise and reliable results.
Analyzer
180° double focusing hemispherical analyzer with 128-channel detector
X-ray source
Al Ka micro-focused monochromator with variable spot size
Ion gun
Energy range 100-4000 eV
Charge compensation
Dual beam source
Sample size
4-axis sample stage, 60 x 60 mm sample area, 20 mm maximum sample thickness
Options
Vacuum transfer module, tilt module for ARXPS, sample bias module
K-Alpha XPS System features
High-performance X-ray source
The X-ray monochromator allows selection of analysis areas from 50 µm to 400 µm in 5 µm steps, fitting it to the feature of interest to maximize the signal.
Optimized electron optics
The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.
XPS sample viewing
Bring sample features into focus with the K-Alpha XPS System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.
Insulator analysis
The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing.
Depth profiling
Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.
Optional XPS sample holders
Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.
Avantage Software
Intuitive operation guided by Avantage Software makes the K-Alpha XPS System ideal for both multi-user shared facilities and XPS experts who place a premium on efficient operation and high-throughput analysis.
K-Alpha XPS System specifications
| Analyzer type |
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| X-ray source type |
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| X-ray spot size |
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| Depth profiling |
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| Maximum sample area |
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| Maximum sample thickness |
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Vacuum system |
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| Optional accessories |
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XPS analysis resources
K-Alpha X-ray Photoelectron Spectrometer System webinar
XPS analysis videos
XPS analysis application notes
K-Alpha XPS System documentation
For Research Use Only. Not for use in diagnostic procedures.