Nexsa G2 Surface Analysis System

XPS surface analysis system from Thermo Fisher Scientific

The Thermo Scientific Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. By integrating XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, it allows you to conduct true correlative analysis.

 

The system now includes options for sample heating and sample biasing capabilities to increase the range of possible experiments. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

4:12

The Nexsa G2 System: An Introduction with Tim Nunney

Learn more about the Nexsa G2 Surface Analysis System at thermofisher.com/nexsa

Nexsa G2 Surface Analysis System features

High-performance X-ray source

A new, optimized X-ray monochromator design makes it possible to select an analysis area from 10 µm to 400 µm in 5 µm steps, ensuring data is collected from the feature of interest while maximizing the signal.

High-performance X-ray source
Optimized electron optics

Optimized electron optics

The high-efficiency electron lens, hemispherical analyzer, and detector allow for superb detectability and rapid data acquisition.

XPS sample viewing

Bring sample features into focus with the Nexsa G2 Surface Analysis System's patented optical viewing system and XPS SnapMap, which helps you pinpoint areas of interest quickly.

XPS sample viewing
Insulator analysis

XPS insulator analysis

The patented dual beam flood source couples low-energy ion beams with very low energy electrons (less than 1 eV) to prevent sample charging during analysis, which eliminates the need, in most cases, for charge referencing. 

XPS depth profiling

Go beyond the surface with the EX06 ion source. Automated source optimization and gas handling ensure excellent performance and experimental reproducibility.

XPS depth profiling
Optional XPS sample holders

Optional XPS sample holders

Expand your possibilities with available specialist sample holders for angle-resolved XPS, sample bias measurements, or inert transfer from a glove box.

Avantage Software

Instrument control, data processing, and reporting are all controlled from Thermo Scientific Avantage Software. Avantage Software includes Knowledge View, a comprehensive source of tutorials and reference material that guide users through analysis.

Avantage Software
Correlative XPS imaging and surface analysis workflow

Correlative XPS imaging and surface analysis workflow

Correlate XPS data with SEM images through the correlative imaging and surface analysis  workflow using Thermo Scientific Maps Software.

Nexsa G2 Surface Analysis System specifications

Analyzer type
  • 180°, double-focusing, hemispherical analyzer with 128-channel detector
X-ray source type
  • Monochromated, micro-focused, low-power Al K-Alpha X-ray source
X-ray spot size
  • 10–400 µm (adjustable in 5 µm steps)
Depth profiling
  • EX06 monatomic ion source or MAGCIS dual-mode ion source
Maximum sample area
  • 60 x 60 mm
Maximum sample thickness
  • 20 mm

Vacuum system
  • Two turbo molecular pumps, with automated titanium sublimation pump and backing pump 
Optional accessories
  • UPS, ISS, REELS, Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration

XPS analysis resources

Nexsa G2 Surface Analysis System webinar

On-demand webinar: Thermo Scientific Nexsa G2 Surface Analysis System demo

Learn how the Nexsa G2 XPS System can be used to investigate a wide range of materials using XPS, UPS, ISS, REELS, Raman spectroscopy, and more.

ESCALAB QXi XPS Microprobe webinar

XPS analysis videos

3:16

Thermo Scientific Nexsa Surface Analysis System

High sensitivity for large areas, small X-ray spots for features and integrated surface analysis techniques, the Nexsa system has it all!
53:10

Part 1- Understanding Surface Chemistry with Avantage Software

Understanding Surface Chemistry with Avantage Software
59:16

Part 2 - Understanding XPS images and depth profiles with Avantage Software

By watching the webinar, you will learn how to: Use the right tools to understand multi-level data sets, such as depth profiles and images. Apply multi-variate techniques (such as PCA) to understand XPS images. Peak fit depth profile data sets to
59:43

The Surface Analysis Toolbox Combining XPS with ISS, REELS, AES, UPS, and Raman in a workflow

This webinar will introduce these additional techniques and show how they can be used with XPS to build comprehensive understanding of the surfaces of materials.
56:39

Multi-technique and Complementary Analysis session (part 2) of the Ignite Surface Analysis Virtual Scientific Conference

The speakers Roland Barbosa (Covalent Metrology), Paul Mack and Herman Lemmens (Thermo Fisher Scientific) give presentations on multi-technique and complementary analysis.

XPS analysis application notes

Nexsa G2 Surface Analysis System documentation

For Research Use Only. Not for use in diagnostic procedures.

1x1 image pixel for data collection