Nexsa G2 Surface Analysis System
Nexsa G2 Surface Analysis System
Thermo Scientific™

Nexsa G2 Surface Analysis System

Deliver surface analysis to maximize your materials' potential with integrated techniques for correlative data and high throughput with research quality results with Thermo Scientific™ Nexsa™ X-Ray Photoelectron Spectrometer (XPS) System.
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Description:
Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities

The Thermo Scientific™ Nexsa G2 X-Ray Photoelectron Spectrometer (XPS) System offers fully automated, high-throughput surface analysis, delivering the data to advance research and development or to solve production problems. The integration of XPS with ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allows you to conduct true correlative analysis. The system now includes options for sample heating and sample biasing capabilities to increase the range of experiments now possible. The Nexsa G2 Surface Analysis System unlocks the potential for advances in materials science, microelectronics, nanotechnology development, and many other applications.

Find additional information here: Nexsa G2 Surface Analysis System

Powerful Performance from Standard Features: 
  • High-performance X-ray source
  • Optimized electron optics
  • Sample viewing
  • Insulator analysis
  • Digital Control
  • NX sample heater module
Optional Upgrades: Add any of the integrated and fully automated techniques to your analysis. Run at the touch of a button.
  • ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
  • UPS: Ultraviolet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
  • Raman: Spectroscopic technique used to in chemistry to provide a structural fingerprint
  • REELS: Reflection electron energy loss spectroscopy
SnapMap

Bring sample features into focus with SnapMap's optical view. The optical view helps you pint point areas of interest quickly while developing a fully focused XPS image to further define your experiment.
1. X-rays illuminate a small area on the sample.
2. Photo electrons from that small area are collected and focused into the analyzer
3. Spectra are continually acquired as the stage is moving
4. Stage position monitored throughout data acquisition, positions used to generate SnapMap 

Application Areas
  • Batteries
  • Biosurfaces
  • Catalysts
  • Ceramics
  • Glass coatings
  • Graphene
  • Metals & oxides
  • Nanomaterials
  • OLEDs
  • Polymers
  • Semiconductors
  • Solar cells
  • Thin films
Specifications
Sampling Area60 x 60 mm
X-Ray Source TypeMonochromated, Microfocused, low power Al K-Alpha
X-Ray Spot Size10 to 400 μm (adjustable in 5 μm increments)
Analyzer Type180° double-focusing, hemispherical analyzer with 128-channel detector
Depth ProfilingEX06 monatomic ion source or MAGCIS dual-mode ion source
DescriptionNexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
Optional AccessoriesUPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, NX sample heating module, sample bias module, vacuum transfer module, adaptor for glove box integration
Thickness (Metric) Max. Sample20 mm
Vacuum SystemTwo turbo molecular pumps, with automated titanium sublimation pump and backing pump
Unit SizeEach