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The Thermo Scientific™ Celestron™ TLP/VF-TLP Test System can be configured for both Standard TLP and VF-TLP for testing at the wafer level and/or package level. Optional probes can also be used to measure signals on pins or pads other than the ones being stressed. The Celestron system software is the most comprehensive in the industry and utilizes graphics to assist in system setup and connection to the DUT. During test operations, it displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements, and DC I-V curve trace data. The operator can select the range of test voltages (stress pulses), pulse polarity, leakage and curve trace parameters. The position and duration of the measurement window within the TLP pulse can also be selected, and modified after the data is collected.
Product Type | Celestron TLP/VF-TLP Test System |
Voltage | 100/240 V |
Test Voltage Range | Up to 2000 V |
Certifications/Compliance | Transmission Line Pulse (TLP): Designed in compliance with the current ESD Association Standard Practice Document |
Dimensions (L x W x H) | 23 x 22 x 24.5 in. (58.5 x 56 x 62.25 cm) |
Hertz | 50/60 Hz |
Humidity Range | 10 to 80% non-condensing |
Specifications Details | Options: Bias supply up to ±50V and 2A DUT test fixture boards Semi-automatic prober interface software Custom charge lines (pulse width): 30ns to 200ns VF-TLP charge lines: 1.2 to 10ns Custom time delay/TDR-S cables: 10ns to 200ns Variable pulse widths and rise times from 0.2 to 20ns Computer switching between 3 pulse widths Computer switching between 3 rise times Coaxial and solid wafer probe needles Kelvin probes to remove wafer contact resistance Additional ground wafer probes (for TDR and TDT only) Wafer probes of various radius tips in tungsten and copper |
Temperature Range | 40°F to 112°F (5°C to 44°C) |
Weight (English) | Standard system weight: 85 lb., Shipping weight: 200 lb. |
Weight (Metric) | Standard system weight: 38.6 kg; Shipping weight: 91 kg |
Unit Size | Each |
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