Electron Microscopes

The Thermo Scientific™ Helios 5 Hydra UX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It combines the new, innovative multiple ion species PFIB column with the monochromated Thermo Scientific Elstar SEM Column to provide the most advanced focused ion- and...

The Thermo Scientific™ Helios 6 HD FIB-SEM is designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology. This latest addition to the Thermo Scientific family of industry standard DualBeam instruments is capable of manual or semi-automated TEM...

The Thermo Scientific™ Aquilos™ Cryo-FIB is the first cryo-DualBeam™ (focused ion beam/scanning electron microscope) system dedicated to preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a cryo-transmission electron microscope...

Ultra-versatile high-resolution SEM with unique environmental capability. The Thermo Scientific™ Quattro ESEM combines all-around performance in imaging and analytics with a unique environmental mode (ESEM™) that allows samples to be studied in their natural state.

Cryo-electron tomography (cryo-ET) provides unprecedented insights into the inner workings of cells, but clear, reliable results depend on high-quality cryo-lamella preparation. The Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB) is specifically designed for automated,...

The Thermo Scientific™ Metrios™ AX S/TEM is a 60–200 kV scanning/transmission electron microscope (S/TEM), designed from the ground up to deliver repeatable TEM- and STEM-based imaging, analytics and gauge capable metrology results at an unprecedented throughput level.

The Thermo Scientific™ Helios™ 5 CX DualBeam is part of the fifth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Elstar™ electron column for ultra high-resolution imaging and the highest...

The Thermo Scientific™ Scios™ 2 DualBeam™ is an ultra-high-resolution analytical FIB-SEM system that provides outstanding sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.

The new Thermo Scientific Apreo ChemiSEM System supports your materials science research by simplifying the imaging process, making it accessible to both expert users and newcomers alike. With innovative features like Smart Frame Integration (SFI) and newly developed autofocus and autostigmation...

The new Thermo Scientific™ Apreo™ 2 SEM expands access to high-performance imaging and analytics to all levels of microscopy expertise. With Thermo Scientific™ ColorSEM Technology, a unique live elemental imaging capability, compositional information is always available, through the most intuitive...

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

Find additional information here: Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) The Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete solution for high resolution, high throughput macromolecular structure...

As the fastest and most reliable instrument in its class, the Thermo Scientific™ Spectra 300 Scanning/Transmission Electron Microscope (S/TEM) provides unprecedented performance for the study of semiconductor materials and semiconductor failure analysis.

The rapid growth in advanced packaging applications, complex interconnect schemes and higher performance power devices is creating unprecedented failure localization and analysis challenges. Defective or underperforming semiconductor devices often show an anomalous distribution of the local power...

The best possible low-kV SEM resolution and materials contrast. The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) is geared toward increasing publishable results from your lab. The Verios SEM enables new insights by extending sub-nanometer resolution over the full 1 keV to 30 keV...