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Focused Ion Beam Electron Microscopes
Focused ion beam, or FIB, electron microscopes, use ion beams for high-resolution imaging of samples. Products can be used in laboratory, industrial, and other settings for various applications.
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Fastest high-quality sub-surface and 3D characterization at millimeter scale with nanometers resolution. The Thermo Scientific™ Helios™ 5 Laser PFIB delivers unmatched capabilities for extreme large-volume 3D analysis, Ga-free sample preparation, and precise micromachining.
TEM sample preparation with the Helios 5 EXL DualBeam FIB SEM is automated and wafer-based, enabling the analysis of advanced 5 nm semiconductor nodes and more.
High-quality observation and characterization of materials often require an artifact-free surface, which can be difficult to achieve with traditional polishing techniques like grinding or mechanical polishing.
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A plasma focused ion beam scanning electron microscope (plasma-FIB SEM) combines improved sputtering efficiency with nanometer imaging resolution at either room temperature or under cryogenic conditions. This provides a fast way to capture large specimen volumes.
Scientists and engineers in both academia and industry are constantly facing new challenges that require highly localized characterization of a wide range of samples and materials. The ongoing drive to improve the quality of these materials means that structural and compositional information at the...
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Helios 6 HD FIB-SEM Datasheet
Brochure: FIB-SEM instruments for materials science