Transmission Electron Microscopes

Scanning transmission electron microscope for imaging and spectroscopy of beam sensitive materials.

The Thermo Scientific™ Talos™ F200X is a scanning transmission electron microscope (S)TEM that combines outstanding high-resolution (S)TEM and TEM imaging with energy dispersive X-ray spectroscopy (EDS) signal detection.

The new, fully integrated, and advanced Thermo Scientific Iliad (S)TEM features the new Iliad EELS Spectrometer and Energy Filter with the dedicated Zebra camera as well as the NanoPulser, our new electrostatic beam blanker.

The Thermo Scientific™ Talos F200i (S)TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications.

The Thermo Scientific™ Themis™ ETEM builds on the proven Titan ETEM concept-combining both standard S/TEM and dedicated environmental TEM capabilities for time-resolved, in situ studies of the dynamic behavior of nanomaterials.

The Thermo Scientific™ Themis™ S S/TEM is an 80–200kV scanning / transmission electron microscope (S/TEM) designed for high-speed imaging and analysis of semiconductor devices. As the latest member of the industry-standard Themis family, the Themis S TEM inherits a unique combination of the best...

As the fastest and most reliable instrument in its class, the Thermo Scientific™ Spectra 300 Scanning/Transmission Electron Microscope (S/TEM) provides unprecedented performance for the study of semiconductor materials and semiconductor failure analysis.

Find additional information here: Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) The Thermo Scientific™ Glacios™ 2 Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete solution for high resolution, high throughput macromolecular structure...

Advanced logic and memory manufacturing processes are becoming more reliant on fast turnaround of precise structural and analytical data to be able to quickly calibrate tool sets, diagnose yield excursions, and optimize process yields.

The Thermo Scientific Talos F200E (Scanning) Transmission Electron Microscope provides high-resolution STEM and TEM imaging with minimal distortion, combined with high-throughput energy-dispersive X-ray spectroscopy (EDS) functionality, tailored for a wide range of semiconductor defect analysis and...

The Thermo Scientific™ Talos™ F200S scanning/transmission electron microscope(S/TEM) combines outstanding high-resolution S/TEM and TEM imaging with industry-leading energy dispersive x-ray spectroscopy (EDS).

Learn more about Krios 5 Cryo-TEM Designed for high performance single particle analysis, cryo-electron tomography (cryo-ET) and microcrystal electron diffraction (MicroED), the Thermo Scientific Krios 5 Cryo-Transmission Electron Microscope (Cryo-TEM) is capable of quickly producing high-quality...

(S)TEM reference metrology for the semiconductor industry. The Metrios (S)TEM offers fully automated reference metrology for enhanced throughput, repeatability, and scalability in high-volume semiconductor analysis. Find out more about Metrios 6 (S)TEM

The Thermo Scientific™ Talos L120C TEM is a 20-120 kV thermionic (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, cell organelles, asbestos, polymers, and soft...

The Thermo Scientific™ Talos™ F200C transmission electron microscope (TEM) is a powerful, versatile system for delivering 3D characterization of biological and biomaterials samples in cell biology, structural biology, and nanotechnology research.