Electron Backscatter Diffraction Spectrometers

Electron Backscatter Diffraction Spectrometers

Spectromoters that employ microstructural-crystallographic characterization to analyze material structure, crystal orientation, phase, or strain. Products are used with electron microscopes and in the study of crystalline/polycrystalline materials.
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Lumis EBSD Detector Thermo Scientific™
Rapidly identify crystallographic phases, grain sizes and orientation, and monitor structural transformations in scanning electron microscope (SEM) samples with EBSD technology designed for maximum throughput and high resolution.
Quasor II™ EBSD System Thermo Scientific™
Perform simultaneous acquisitions of EBSD data and EDS/WDS spectral images with ease using the Thermo Scientific™ Quasor II™ Electron Backscatter Diffraction. The Quasor II EBSD characterizes crystalline structures which affect physical properties in a wide range of materials examined with scanning...
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New CMOS camera technology enables a significant improvement in sensitivity and speed. Choose from our Quasor II electron backscatter diffraction (EBSD) detector for fast collection rates and accurate pattern detection and indexing at an affordable price.
Most materials used in manufacturing come from earthly sources, typically starting as an ore extracted from the ground. The ability to characterize geological samples and minerals is critical to geologists, the mining industry, and companies that use beneficial materials from mineral deposits.