10 Jul 2020

Segment TEM data without artifact and background effect

Segment TEM data aided by the Structure enhancement filter.

Xtra_TEM

TEM datasets always present an obvious artifact tail viewing in the Z-direction, as well as an inhomogeneous background. The artifact tails are easily segmented along with the central signal by directly thresholding . Inhomogeneous background of EM data also make the segmentation much more complicated. EM data can be much more easily segmented with the help of the Structure enhancement filter, without the effect of artifacts  (TEM) and an inhomogeneous background.   

In the workflow, use the TCL command which rotates the data 90 degrees along the x-axis to begin with. This changes the artifact to the xy-plane and facilitates structure enhancement. 

Data courtesy of Dr. Kexiang Zhang. Guilin University of Electronic Technology