Search Thermo Fisher Scientific
Webinar on-demand
Duration: 60 minutes
In this webinar we introduce the TruePix Electron Backscatter Detector, an innovative detector that delivers a new level of diffraction analysis to the electron microscope. With its high-speed, high-sensitivity direct electron detection, and accessible workflows, the TruePix Detector offers exciting possibilities for researchers across materials science.
In this webinar, you will:
- Gain a comprehensive understanding of EBSD as our experts guide you through the basic principles of EBSD analysis for microstructural characterization
- Explore the basics of direct electron detection, with an overview of the hardware and signal processing, and how this makes it possible to count all electrons above a threshold
- Learn how key sensitivity metrics, including median electron counts, can be used to quantify detector sensitivity
- Understand how integrated and automated setups enable faster time to acquisition and shorter time to results, saving valuable time in your industrial processes
In this webinar you see how pairing the TruePix EBSD Detector with the Apreo ChemiSEM System can enhance your research capabilities.
About the speakers
Jakub Holzer, PhD, Application Scientist, Thermo Fisher Scientific
Based in Brno, Czech Republic, Jakub is responsible for application development of mid-range Thermo Scientific DualBeam FIB-SEMs and diffraction-based analytical and imaging techniques, such as electron backscatter diffraction. Jakub acquired his PhD from the Central European Institute of Technology while working at the Institute of Physics of Materials of the Czech Academy of Sciences and the Paul Scherrer Institute.
Chris Stephens, Product Marketing Manager, Thermo Fisher Scientific
Chris focuses on analytical SEM, working with users across materials science to characterize samples using SEM microanalytical techniques, including EBSD. He completed a PhD in physics at the University of Leeds, studying phase transformations within confined systems using electron microscopy to characterize changes in material structure. Chris enjoys developing SEM microanalytical workflows and is currently focused on high-throughput and high-sensitivity applications.