In situ microscopy software solutions from Thermo Fisher Scientific

Scanning electron microscopy software, transmission electron microscopy software and FIB SEM imaging software for in situ materials analysis. Thermo Scientific software offers python programming language-based application programming interface that offers automated control of Thermo Scientific SEM, TEM and FIB SEM instruments.


AutoScript Software

Python based application programming interface (API) that offers control of Thermo Scientific SEM and DualBeam systems to enable custom automation

Thermo Scientific AutoScript Software enables full control over the microscope allowing to automate any simple or complex task, such as for example preparation of samples for in situ mechanical testing, combining it with the extensive capabilities of Python libraries for advanced image processing, computation, AI, and more.

 

Key features

  • Control of SEM and FIB imaging and pattering, including detection
  • Control of stage and gas injection system
  • Easy to use interface with object browsing and auto completion
AutoScript Software

Auto Slice & View Software

Automated FIB serial sectioning software with 3D EDS and 3D EBSD capability

Thermo Scientific Auto Slice & View (AS&V) Software allows for automated acquisition of high-resolution 3D images and analytical maps such as EBSD (electron backscatter diffraction) or EDS (energy-dispersive X-ray spectroscopy).  

 

Key features

  • Intuitive, easy to use UI
  • Digital tilt-shift compensation
  • On-the-fly editing capabilities
  • Integrated imaging
  • Information on every slice
  • Highly flexible and reliable acquisition
  • High speed and throughput
Auto Slice & View Software

μHeater Holder

Fully integrated, ultra-fast heating solution for in situ high resolution imaging at temperatures up to 1200 °C

One product, diverse applications The Thermo Scientific μHeater holder is a high vacuum compatible ultra-fast heating stage for in situ sample heating up to 1200 °C. It takes advantage of the dual nature of our DualBeam instruments by allowing for sample preparation by FIB and transfer to a MEMS device without breaking vacuum in the vacuum chamber.

 

Key features

  • Ultra-fast heating solution for in situ high resolution imaging
  • Fully integrated
  • Temperatures up to 1200 °C

For Research Use Only. Not for use in diagnostic procedures.

1x1 image pixel for data collection