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Assess metal quality with these techniques
Depending on your needs, there are a handful of metal characterization techniques that can help you better understand your samples. From getting a clear view of the surface or nanoparticles to identifying elemental composition and inclusions, these techniques can help you produce higher-quality, longer-lasting products.
Metals elemental analysis with EDX
Energy dispersive X-ray spectroscopy (EDS, also known as EDX or XEDS) is an analytical method for characterizing chemical composition at macro, micro, and nanoscales.
It involves gathering compositional data by detecting X-rays emitted during electron beam scanning, with each element identified by its unique X-ray line profile.
EDS is applicable to the entire periodic table, offering insights into element distribution.
It aids in comprehensive material analysis across industrial and academic domains, encompassing applications from quality control and failure analysis to fundamental research.
ChemiPhase analysis instantly transforms EDS mapping into unique chemical components for this steel macro-inclusion, including for each phase a spectrum, quantified composition and area fraction.
Inclusion analysis of steel, aluminum, and other metals
Microscale inclusions are found in alloys of steel, aluminum, and other metal systems.
In steel, the populations of oxides and sulfides reflect the high temperature refining conditions.
In aluminum, tramp iron and alloyed heavy metals combine to form intermetallic compounds.
In both cases, the composition and size distribution of these microscale particles have an impact on final product properties such as strength, ductility, and fatigue life.
To advance process and product development, a comprehensive grasp of micro cleanliness is essential, and automated SEM-EDS stands as the benchmark for identifying inclusions in metals.
Automated feature analysis has been integrated with the Thermo Scientific Axia ChemiSEM. Collect an image, spectrum and sizing for features that can be distinguished from the background image. Steel inclusions are shown here with overlapping oxides, sulfides and nitrides.
Nanoparticle analysis with EDX
Nanotechnology is reshaping various aspects of our lives. In the textile industry, it leads to advanced clothing with improved stain, odor, and water resistance. Consumer electronics, like smartphones, benefit from increasingly smaller, faster, and better transistors due to nanotechnology. Medicine is exploring nanoparticles for advanced drug and vaccine delivery, and the energy sector is enhancing solar and wind power efficiency.
Nanoparticles leverage the unique properties of atoms and molecules at the nanoscale. Some excel in conducting electricity, heat, strength, magnetic properties, or light reflection. Their significant surface area makes them effective chemical catalysts in industrial and automotive applications.
Cu and Zr precipitates in a lamella of aluminum 2099 alloy characterized by APW.
To understand nanoparticles better, quantifying their composition, sizes, and shapes is essential. Researchers worldwide employ scanning and transmission electron microscopes (S/TEM) with energy dispersive X-ray spectroscopy (EDX) for sub-nanometer-scale imaging and chemical data, unveiling insights into nanoparticle arrangement and functions.
Demand for large area correlative imaging has grown, preserving observational context while providing robust data. Thermo Scientific Maps Software automates high-resolution image acquisition across samples, stitching them into a single image. Additionally, Thermo Scientific Avizo Software offers real-time statistics on nanoparticle size, surface area, perimeter, distribution, and chemical composition. It enables correlation of images and chemical information from different microscopes, ensuring context retention.
Automated Particle Workflow
The Thermo Scientific Automated Particle Workflow (APW) optimizes the research and product development process in industrial, academic, and government labs with a comprehensive software package that streamlines chemical analysis workflows. APW is the sole solution that automates the entire workflow, from acquisition to automated processing. This allows for rapid acquisition of statistically significant, high-resolution (nanoscale) results over extensive areas. APW seamlessly integrates with Thermo Scientific Talos (S)TEM and Thermo Scientific Spectra (S)TEM instruments, along with Thermo Scientific Maps Software, resulting in significantly improved data statistics (50 in total vs. >500/hour) while simplifying the process.
Dynamic software integration that streamlines chemical analysis
XPS surface analysis of metals
X-ray photoelectron spectroscopy (XPS), or electron spectroscopy for chemical analysis (ESCA), is a common surface characterization tool in applications including non-stick cookware coatings, thin-film electronics, and bio-active surfaces. XPS measures the elemental composition, chemical, and electronic state of atoms on a material's surface to analyze its surface chemistry.
XPS spectra are obtained by irradiating a solid surface with a beam of X-rays and measuring the kinetic energy of electrons that are emitted through the photoelectric effect from the top 1-10 nm of the material. A photoelectron spectrum is recorded by counting ejected electrons over a range of kinetic energies. The energies and intensities of photoelectron peaks enable identification and quantification of all surface elements, except for hydrogen.
XPS offers a significant advantage in detecting subtle changes in the position of peaks that reflect the chemical state of surface elements, such as metallic or oxidized states, and diverse bonding states in polymers. However, the analysis depth is limited to a few nanometers due to electron-matter interactions. Electrons lose energy quickly as they interact with matter, preventing their detection as part of a peak.
Schematic of an XPS instrument. X-rays are created and monochromated to ensure good energy resolution before irradiating the sample. The created photoelectrons are focused into an analyzer and counted by a detector to create a spectrum.
Metal characterization instruments
Axia ChemiSEM
SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. The Thermo Scientific Axia ChemiSEM seamlessly integrates EDS data acquisition, employing concurrent signal processing algorithms for simultaneous display of sample morphology and quantitative elemental composition in real time. It continually processes EDS data in the background, providing live elemental updates as they are obtained. Users can selectively toggle elements on and off to focus on specific regions of interest within their samples.
Key features:
- High-resolution imaging at the analytical working distance.
- Versatile material analysis to support a wide range of beam-sensitive, composite, magnetic, and nano-materials
- Integrated EDS capabilities with ChemiSEM Technology enable complex, live quantitative elemental analysis in a single, streamlined process
- Productivity-boosting automation includes self-aligning optics, multiple detectors, a large multi-sample stage, and fast pump down
Apreo ChemiSEM System
Thermo Scientific Apreo ChemiSEM delivers nanometer to sub-nanometer resolution at a 10 mm analytical working distance. With a FEG source, it supports analysis of beam-sensitive, magnetic, and nano-materials. Integrated EDS enables live quantitative elemental mapping in one streamlined process. Enhanced with automated features, self-aligning optics, multi-detectors, a large stage, and fast pump down, it maximizes throughput and boosts your team's productivity.
Key features:
- High performance, resolution, and contrast
- Wide range of sample types
- Live quantitative EDS with ChemiSEM
- Quick and easy sample loading
- Advanced automation
- Performance at long working distance
Phenom ParticleX Desktop Scanning Electron Microscope
Particle characterization with desktop scanning electron microscopy for materials analysis applications. Thermo Scientific Phenom ParticleX Desktop Scanning Electron Microscope delivers a comprehensive plug-and-play SEM-EDS software solution for particle analysis workflows. Featuring automated characterization, verification, and classification of materials, the instruments support your production with fast, precise, and compliant data.
Key features:
- Fully integrated particle analysis software with SEM-EDS system
- Certified repeatability and reproducibility
- Compliance with industry standards in technical cleanliness, steel inclusion analysis, and gunshot residue analysis
- Automated, unattended long analysis run time
- Small system footprint with built-in, customizable reporting software
- Local language support and training
- Continuous updates based on the latest technology and your feedback
Talos F200X Scanning Transmission Electron Microscope
TEM microscope for high-resolution TEM and STEM results with accurate chemical quantification. The Thermo Scientific Talos F200X STEM is a scanning transmission electron microscope that combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy (EDS) signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. The Talos F200X scanning transmission electron microscope allows for fast and precise EDS analysis in all dimensions, along with high-resolution TEM and STEM (HRTEM and HRSTEM) imaging with fast navigation for dynamic microscopy.
Key features:
- High-resolution, EDS cleanliness, and quality in 2D as well as 3D
- X-FEG and X-CFEG available for the highest brightness and energy resolution
- High accuracy and repeatable results with integrated Thermo Scientific Velox Software
Talos F200i Scanning Transmission Electron Microscope
TEM and STEM analysis for high-throughput, high-resolution chemical characterization and dynamic observations. The Thermo Scientific Talos F200i (S)TEM is a versatile 20-200 kV field emission (scanning) transmission electron microscope tailored for diverse materials science applications. Its X-Twin pole piece gap offers exceptional flexibility, while the consistent electron column allows for high-resolution 2D/3D characterization, in-situ observations, and diffraction studies.
Key features:
- Compact design with X-TWIN objective lens
- Available with S-FEG, X-FEG, and X-CFEG
- Flexible and fast EDS options for comprehensive elemental analysis
Helios 5 Laser PFIB
Combined focused ion beam milling and laser ablation tools. The Thermo Scientific Helios 5 PFIB Laser Systems integrate plasma focused ion beam milling, femtosecond laser ablation, and SEM imaging, creating a powerful "TriBeam" setup. This configuration provides high-resolution imaging and in situ ablation, facilitating rapid millimeter-scale material characterization at nanometer-level precision.
Key features:
- Fast, millimeter-scale cross sections
- Statistically relevant deep subsurface and 3D data analysis
- Shares all capabilities of the Helios 5 PFIB platform
Scios 2 FIB-SEM
Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization. The Thermo Scientific Scios 2 DualBeam is an ultra-high-resolution analytical focused ion beam scanning electron microscopy (FIB-SEM) system that provides outstanding sample preparation and 3D characterization performance for a wide range of samples, including magnetic and non-conductive materials. With innovative features designed to increase throughput, precision, and ease of use, the Scios 2 DualBeam is an ideal solution to meet the needs of scientists and engineers in advanced research and analysis across academic, governmental, and industrial research environments.
Key features:
- Full support of magnetic and non-conductive samples
- High throughput subsurface and 3D characterization
- Advanced ease-of-use and automation
For Research Use Only. Not for use in diagnostic procedures.