Transmission Electron Microscopy Techniques Using the Talos (S)TEM

The Thermo Scientific Panther STEM Detector, part of the Talos portfolio, stands out as a superior solution in the scanning transmission electron microscopy landscape. Fine-tuned for excellence with improved detectors and amplifiers, the Panther STEM Detector excels in multi-signal acquisition and mechanical alignment accuracy. This innovative system offers high throughput, user-friendly operation, and incredible flexibility in signal processing. Its ultra-high electron sensitivity for low-dose applications, coupled with up to 16 segments, sets it apart from competitors and makes it a preferred choice for materials science researchers. Going one step further, Thermo Scientific AutoSTEM Software enhances the Panther STEM Detector, enabling automated focus and astigmatism correction for consistently high-quality images. The embedded piezo-enhanced stage and the seamless ability to switch from HRTEM to HRSTEM further contribute to its efficiency and adaptability.

The Talos (S)TEM X-TWIN lens provides highly advanced scanning transmission electron microscopy resolution and analytical capabilities. The large X-TWIN pole piece gap, that provides high flexibility for a wide range of applications, combined with a reproducibly performing electron column opens new opportunities for high-resolution 3D and in situ dynamic observations. The X-TWIN is available on the Thermo Scientific Talos F200X, F200S, F200i, and F200E (S)TEMs. The 20–200 kV Talos product line is equipped with a fast 4k resolution Thermo Scientific Ceta Camera, which provides, in combination with drift compensated frame integration (DCFI), large field-of-view, drift-compensated imaging with high sensitivity, high speed, and precise sample navigation on a 64-bit platform. Talos (S)TEMs also include the workflow-based Thermo Scientific Velox Software for intuitive acquisition and analysis. All these features combine to make the Talos product line incredibly productive for all facets of STEM.

The iDPC scanning transmission electron microscopy method on Talos (S)TEMs exposes low-Z elements with bright contrast and dark background, placing considerably less dependence on defocus and/or thickness. In addition, it has been shown that iDPC-STEM images have a higher signal to noise ratio compared to ABF-STEM images. A higher signal to noise ratio provides the possibility of low-dose imaging, which is crucial for beam-sensitive materials and charge-prone samples.

Energy dispersive X-ray spectroscopy (EDS) remains a foundational pillar in the world of microanalysis, enabling detailed elemental and phase characterization down to the atomic scale. By capitalizing on the principle of characteristic X-ray emission from electron-sample interactions, EDS produces a comprehensive spectrum that reveals the detailed elemental composition of a specimen. This technique is a mainstay for scientists, technicians, and semiconductor engineers whereby offering both qualitative and quantitative insights into the intricate structure of samples.

In the evolving landscape of advanced materials and semiconductor device characterization, the Talos (S)TEM emerges as a synergistic tool, enhancing the capabilities of EDS. With its integration of the established Thermo Scientific ChemiSTEM Technology, especially with the ultra-high-brightness offered by the X-CFEG, the Talos (S)TEM optimizes the signal-to-noise ratio and facilitates the detection of trace elements with heightened sensitivity. This combination helps ensure that users are equipped with state-of-the-art tools for meticulous materials analysis.

Electron energy loss spectroscopy (EELS) is a cornerstone technique in advanced electron microscopy, providing deep insights into elemental composition, chemical bonding, oxidation states, and electronic properties of both valence and conduction bands. The Talos (S)TEM, equipped with the X-CFEG, stands out in the realm of electron energy loss spectroscopy. The X-CFEG offers excellent electron beam brightness and stability, which is crucial for EELS, to ensure high-energy-resolution imaging and top performance analysis.

As the challenges in materials science and semiconductor development grow in parallel with the study of increasingly complex structures, the demand for precise characterization from cutting-edge instrumentation becomes evident. The Talos (S)TEM, with its advanced features including the X-CFEG, offers superb precision and versatility to help meet these demands and solidify the Talos (S)TEM's position in modern materials research.

Integrated Thermo Scientific Velox Software makes data acquisition fast and easy while supporting analysis of multimodal data. Several automation packages are available on the Talos (S)TEM to help you get better insights into the chemical and structural bonding of materials. Seeing the bigger picture helps in understanding and reveals details that are required to develop new materials.

In the advanced realm of STEM, the incorporation of 3D energy dispersive X-ray spectroscopy tomography offers an unprecedented depth of material characterization. This synergy allows for high-resolution, three-dimensional elemental mapping, transcending the constraints of traditional 2D EDS analyses within STEM studies. The acquisition of volumetric data not only visualizes elemental distributions with nanoscale precision but also reveals intricate interfaces, compositional gradients, and inherent material heterogeneities. As we navigate the challenges of materials science, nanotechnology, semiconductors, and intricate biology, the integration of 3D energy dispersive X-ray spectroscopy tomography in STEM stands as a testament to the next frontier in nanoscale material analysis.

Modern materials science requires multimodal, statistically meaningful data to obtain sample properties across platforms on multiple length scales. This has become increasingly important for research on nanoparticles and catalysis samples as well as for precipitates in metals. Thermo Scientific Maps Software for STEM and EDS automates navigation across multiple instruments and length scales to characterize large volumes quickly and reproducibly, providing accurate contextual analysis on relevant areas.