Learn more about electron microscopy sample preparation

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Electron microscopy sample preparation videos


Electron microscopy sample preparation webinars

Our exciting events and webinars cover a wide range of electron microscopy (EM) topics, including preparation techniques that help you protect sample integrity and how the latest instruments can support your work. These events offer the opportunity to learn from experts in the field and gain valuable insights into the latest trends and developments.

Toward “Damage-Free” TEM Specimen Preparation by Focused Ion Beam without Gallium

Dr. Chengge Jiao, Staff Scientist of Applications Development at Thermo Fisher Scientific, explains how to tailor processing conditions and select the right FIB ion species for certain groups of materials to achieve optimized results. Watch to learn how to diminish the challenges associated with focused ion beam (FIB) sample preparation for high-resolution transmission electron microscopy (HR-TEM).


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