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Electron microscopy facility in Shanghai, China
Investing in new instrumentation or capital equipment is never easy, and you want to make sure you’re getting the perfect solution that meets your needs and expectations. While our white papers and datasheets can help you understand the capabilities of our instruments, dedicated software, and professional services, seeing these solutions applied to your unique samples, use cases, and challenges can help you more thoroughly grasp whether or not they’re right for you.
Our NanoPort Facility, located in Shanghai, China, is an electron microscopy (EM) center of excellence where you can develop and advance your skills with trusted solutions and support, both from our experts as well as from your peers. In the NanoPort Facility, we offer dedicated workflow support through workshops, demos, and training for researchers and engineers in the life sciences, materials science, and semiconductor fields.
Shanghai NanoPort Facility
Building A
No.2517 Jinke Road, Zhangjiang Hi-Tech Park
Pudong New Area
Shanghai, China
Phone: +86 21 8012 5200
Electron microscopy techniques
The Shanghai NanoPort Facility has over 40 professionals with many years of hands-on experiences at customer sites and most of them hold a PhD or MSc in their area of expertise.
We invite you to bring your own sample to the Shanghai NanoPort Facility to personally experience the difference our instrumentation, software, and knowledge can make for your challenging analysis and characterization needs.
See the Thermo Fisher Scientific difference – the expertise and analytical techniques available at the Shanghai NanoPort Facility include:
For materials science
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- DualBeam microscopy (combined focused ion beam and SEM (FIB-SEM) tools)
- X-ray photoelectron spectroscopy (XPS)
For semiconductors
- Transmission electron microscopy (TEM)
- Scanning electron microscopy (SEM)
- DualBeam microscopy (combined focused ion beam and SEM (FIB-SEM) tools)
- Device Characterization
- Defect Localization
For life sciences
Events at the Shanghai NanoPort electron microscopy facility in Shanghai, China
Workshops: A combination of discussion and practical work focusing on a particular subject/industry, where we encourage attendees to share their knowledge and experience.
In-house courses: Hands-on in-person training that helps customers build their electron microscopy application skillset.
Please contact us to learn more about the cost of these events and how to schedule them.
Electron Microscope Training
The training needs of each facility can vary greatly. To address these challenges, we have developed flexible training options to bring our best application scientists and training material to you, no matter where you are in the world. Onsite training, remote training, and eLearning options each have advantages while serving different needs, so the best approach is often a blend of all three learning experiences.
Electron microscopes and analytical instruments available at the Shanghai electron microscopy facility
DualBeam instruments
Thermo Scientific Helios Hydra DualBeam (plasma FIB) Plasma focused ion beam scanning electron microscopy with multiple ion species for 3D EM and TEM sample preparation. For Materials Science, Semiconductors, Life Sciences
Thermo Scientific Helios 5 UXe PFIB DualBeam Plasma focused ion beam scanning electron microscope for TEM sample preparation including 3D characterization, cross-sectioning and micromachining. For Materials Science, Semiconductors
Thermo Scientific Helios 5 UX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductors
Thermo Scientific Helios 5 CX DualBeam Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. For Materials Science, Semiconductors
Thermo Scientific Scios 2 DualBeam Focused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization. For Materials Science, Semiconductors
Thermo Scientific Aquilos 2 DualBeam Cryo-EM sample preparation tool with extended run time and enhanced automation. For Life Sciences
Thermo Scientific Helios 6 HD FIB-SEM Designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology For Semiconductors
Transmission electron microscopes
Thermo Scientific Spectra 300 X-CFEG TEM High resolution TEM and STEM microscope for all materials science and semiconductor applications. For Materials Science, Semiconductors
Thermo Scientific Talos F200i TEM TEM and STEM analysis for high throughput, high resolution chemical characterization and dynamic observations. For Materials Science, Semiconductors
Thermo Scientific Talos F200E TEM 200 kV TEM and STEM for repeatable, high-volume analysis of a broad range of semiconductor and microelectronic devices. For Materials Science, Semiconductors
Thermo Scientific Talos L120C TEM TEM microscope for sample screening and high contrast TEM and STEM imaging of beam sensitive materials. For Materials Science, Life Sciences
Thermo Scientific Glacios 2 Cryo-TEM Sample optimization and high resolution data acquisition made easy. For Life Sciences
Thermo Scientific Tundra Cryo-TEM A dedicated structural analysis solution designed to bring cryo-electron microscopy (cryo-EM) to your laboratory at an affordable price point. For Life Sciences
Scanning Electron Microscopes
Thermo Scientific Apreo 2 SEM Scanning electron microscope for versatile, high performance materials imaging and analysis. For Semiconductors, Materials Science, Life Sciences
Thermo Scientific Quattro ESEM Environmental scanning electron microscope (ESEM) for the study of materials in their natural state. For Semiconductors, Materials Science, Life Sciences
Thermo Scientific Axia ChemiSEM SEM EDS instrument that is flexible, easy to use, and offers instantaneous, quantitative elemental analysis. For Materials Science, Semiconductors, Life Sciences
X-ray photoelectron spectrometers
Thermo Scientific ESCALAB QXi X-ray Photoelectron Spectrometer Microprobe Multi-technique surface analysis instrument with high-resolution X-ray photoelectron spectroscopy and imaging. For Materials Science, Semiconductors
Thermo Scientific Nexsa G2 Surface Analysis System X-Ray photoelectron spectrometer with automated surface analysis and multi-technique capabilities. For Materials Science, Semiconductors
Electrical failure analysis systems
Thermo Scientific ELITE System Lock-In IR Thermography system for accurate defect localization in semiconductor devices. For Semiconductors
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